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本文介绍了cu6800功能测试的一种测试方法及程序的研制。这种方法立足于测试技术的先进性、测试程序的有效性、实用性与经济性。以生产厂和用户之间交接产品时共同遵守的测试为宗旨,并对各类不同用户的使用环境提供方便。该方案吸收了一些国际上较先进的测试方法的长处,并有所改进,称为功能与结构兼测法。在对微处理机进行功能测试的同时,加强对弱点(容易出故障的工作部位)的测试。考虑微处理机工作时的内部干扰、信号丢失、传输延时、时钟链、进位链、时钟负载、频率范围(尤其是高低端情况)、逻辑传送、驱动能力等因素。文章说明了功能与结构兼测法的思想及其实现。
This article describes a cu6800 functional test of a test method and program development. This method is based on the advanced nature of the test technology, test the effectiveness of the program, practicality and economy. In the production plant and the transfer of products between users to comply with the test for the purpose of testing, and for all types of users to provide convenient environment. The program has absorbed some of the advantages of some of the more advanced test methods in the world and has made some improvements. They are called functions and structures and test methods. While testing microprocessors for functionality, enhance testing of weak points (easy-to-fail work sites). Consider the microprocessors work internal interference, signal loss, transmission delay, clock chain, carry chain, clock load, frequency range (especially high and low end conditions), logic transmission, drive capacity and other factors. The article illustrates the idea of function and structure and test method and its realization.