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自从1974年西德H.Ebel等人首先使用基本参数法X射线荧光分析技术绝对测量薄层厚度以来,已经有许多人在改进这项技术,并取得了进展。使用这种方法可以不需要任何标准样品,非破坏性地绝对测量几乎任意材料组合的镀层厚度。但是这些方法都局限在单镀层,而在生产中常见的是复合镀层。如铜基上镀镍再镀金;铁基上镀铜再镀镍;黄铜上镀银再镀金等。对于复合镀层,美国R.J.Russell在1977年研究了多层之间二次荧光对测量结果的影响。
Since 1974, H.Ebel et al., West Germany, first of all using basic parameter method X-ray fluorescence analysis of absolute measurement of thin layer thickness, there have been many improvements in this technology, and made progress. With this method, it is possible to absolutely measure the coating thickness of virtually any material combination without any need for any standard samples. However, these methods are limited to a single coating, and in the production of composite coating is common. Such as copper-based nickel and then gold-plated; iron-based copper and nickel-plated; brass and then plated with gold such as silver. For composite coatings, R.J. Russell in the United States in 1977 studied the effect of secondary fluorescence between layers on the measurement results.