论文部分内容阅读
本文在显像管加迅寿命试验的基础上,为了对加速方程作进一步了解,利用IMA(离子微探针)和SEM(扫描电镜),对不同寿终管子的失效机理进行了初步分析,由于管内氧化物阴极是显像管失效的主要方面,因此,在不同点燃寿命下,对阴极涂层及其表面活性Ba的分布作了探铡。结果表明,活性Ba在涂层内部有富集区,并随寿命而降低。在涂层表面有活性Ba的存在,并且其相对含量也随寿命而下降。同时,还对不同管子寿命的基金属也做了IMA及SEM剖面分析,发现活性Ba有向基金属方向反扩散现像。由于Ba的半径大于Mg,因而有堵塞Mg继续向界面扩散的可能性,使Mg供应受阻,Ba的生成率下降,当下降到某一程度后,造成阴极失效,进而使管子失效。
In this paper, on the basis of X-ray tube life test, in order to further understand the acceleration equation, the failure mechanism of tubes at different end of life was analyzed by using IMA (ion microprobe) and SEM (scanning electron microscope) Cathode cathode is the main aspect of tube failure. Therefore, the distribution of cathode coating and its surface active Ba is explored under different ignition lifetime. The results show that the active Ba in the coating inside the enrichment zone, and with life expectancy decreased. The presence of active Ba on the coating surface, and its relative content also decreases with life expectancy. At the same time, but also for different tube life of the base metal also made IMA and SEM profile analysis, found that active Ba has direction to the base metal anti-proliferation phenomenon. As the radius of Ba is larger than that of Mg, there is a possibility of blocking the diffusion of Mg to the interface, which hinders the supply of Mg and reduces the formation rate of Ba. When the radius of Ba is decreased to a certain extent, the cathode fails and the tube fails.