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电镜泄漏的X射线对人体的损害最常见的是引起造血系统的改变,以及损伤眼晶体产生晶状体混浊。因而电镜工作者搞好X射线的防护工作是至关重要的。过去我们对进口电镜的X射线泄漏有所忽视,近来我们使用FD—71型X射线探测器对我所电镜室的日立H—600型透射电镜反复进行检测,在加速电压100kV,束流25μA,束斑10μ的测定条件下,发现观察室与快门杆的接合处X射线泄漏量高达3.54mR/hr(毫伦琴/小时),比国家规定的安全剂量0.25毫雷姆/小时(约0.29mR/hr)高12倍原因是观察室与快门杆接合处壁厚明显减薄,尽管壁内装有铅和其他合金材料的防护层,但荧光屏处产生的穿透力很强的X射线仍从这防护薄弱的地方泄漏出来。
Electron microscope leak X-ray damage to the human body is the most common cause changes in the hematopoietic system, as well as damage to the ocular crystal lens opacity. Therefore, electron microscope workers to do a good job of X-ray protection is crucial. In the past, we have neglected the X-ray leakage of imported electron microscope. Recently, we used the FD-71 X-ray detector to repeatedly test the Hitachi H-600 TEM in our electron microscope room. At an accelerating voltage of 100kV, a beam of 25μA, It was found that the X-ray leakage at the junction of the observation chamber and the shutter rod was as high as 3.54 mR / hr (millirex / hour) and 0.25 millimole / hr (0.29 mR / hr) is 12 times higher because of the significantly thinner wall at the junction of the observation chamber and the shutter rod. Despite the protective layers of lead and other alloy materials in the wall, the X-rays with strong penetrating power generated at the phosphor screen remain protected Weak place leaked out.