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本文从实验上测量了单模石英光纤在－50～120℃范围内的损耗。随着温度升高，光纤的损耗随之降低，在常温附近达到最小。其后损耗随着温度的继续升高而增加。损耗的变化主要是由于杂质的吸收和微弯损耗。本文对杂质的吸收以及微弯损耗进行了数值模拟，并且从理论上定性地解释了损耗对温度的依赖关系。
This paper experimentally measured the loss of single-mode silica fiber in the range of -50 ~ 120 ℃. As the temperature rises, the loss of the fiber decreases, reaching the minimum around room temperature. The loss then increases as the temperature continues to increase. The change in loss is mainly due to the absorption of impurities and microbending loss. In this paper, the absorption of impurities and the micro-bending loss are numerically simulated, and the dependence of loss on temperature is theoretically and qualitatively explained.