论文部分内容阅读
未来的计算机、显示器和通讯系统的发展促使信息处理速度的不断加快。实现加快速度的关键取决于目前正在设计中、可控制下一代系统的超高速电子仪器、光电器件和光电电路。但是,使用工作速度比器件本身速度更慢的常规电子仪器来测量器件的性能几乎是不可靠的。为解决这个问题,近来研究了几种技术适用于皮秒量级的测量。其中之一很有特点,该技术采用全光学取样装置,它仅与电—光取样介质和电路间的电场有关。因此,在测量过程中不需要从电路中除去负载。
The future of computers, monitors and communications systems have led to the continual acceleration of information processing. The key to speeding up depends on the ultra-high-speed electronics, optoelectronic devices and optoelectronics that are currently under design and are capable of controlling the next generation of systems. However, it is almost unreliable to measure the performance of a device using a conventional electronic device that operates at a slower speed than the device itself. To solve this problem, several techniques have recently been investigated for the measurement of the picosecond order of magnitude. One of the features is that the technology uses an all-optical sampling device that is only related to the electric field between the electro-optic sampling medium and the circuit. Therefore, there is no need to remove the load from the circuit during the measurement.