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目的:运用基因芯片和RT-PCR技术检测难治性癫脑组织中sh3gl2 mRNA表达,从分子水平探讨难治性癫可能的发病机制。方法:在应用基因芯片对难治性癫患者手术切除的颞叶组织与对照组行基因表达谱分析研究的基础上,筛选出目的基因后用RT-PCR对芯片扫描结果进行验证。结果:候选基因sh3gl2在难治性癫患者脑部颞叶组织中出现高表达,与对照组相比差异有显著统计学意义(P<0.01);RT-PCR结果与芯片结果一致。结论:sh3gl2在难治性癫颞叶皮质中的表达增加,提示了其可能是难治性癫发生发展中的一个重要因素。
OBJECTIVE: To detect the expression of sh3gl2 mRNA in refractory epileptic brain tissue by gene chip and RT-PCR, and to explore the possible pathogenesis of refractory epilepsy at the molecular level. Methods: Gene expression profiling analysis was performed on the temporal lobe of patients with refractory epilepsy and control group by gene chip. The target gene was screened and the result of chip scanning was verified by RT-PCR. Results: The candidate gene sh3gl2 was highly expressed in the temporal lobe tissue of patients with refractory epilepsy, which was significantly different from that of the control group (P <0.01). The result of RT-PCR was consistent with that of the chip. Conclusion: The increased expression of sh3gl2 in the temporal cortex of refractory epilepsy suggests that it may be an important factor in the development of refractory epilepsy.