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本文介绍了ＨＬ－１Ｍ装置等离子体杂质真空紫外辐射观测的初步结果。用类Ｌｉ离子谱线强度比法估计出Ｔｅ≈４００ｅＶ。镀膜后的ＣＥＭ探测器的灵敏度提高。杂质对装置放电有重要影响
This article describes the preliminary results of the observation of vacuum ultraviolet radiation of plasma impurities in HL-1M devices. Te ~ 400eV was estimated using the Li-like line intensity ratio method. The sensitivity of the coated CEM detector increases. Impurities have a major impact on the discharge of the device