论文部分内容阅读
一、引言随着晶体管电路应用的日益广泛,晶体管性能的测试鉴定引起了普遍的重视.晶体管参数的测试,主要是为电路设计服务的.但是小信号测试及直流测试~[3]与雷达、计算机等领域中的电路工作状态(大信号脉冲工作状态)颇有出入.为了鉴定晶体管在脉冲工作状态下的性能,有研究脉冲测试的必要.同时由于制造工艺方面的技术困难,目前晶体管性能的离散性
I. INTRODUCTION As the application of transistor circuits has become more and more widespread, the testing and qualification of transistor performance has attracted a great deal of attention. The testing of transistor parameters mainly serves the circuit design, but small signal test and DC test ~ [3] Computer work in the areas of the circuit state (large signal pulse state) quite different.In order to identify the performance of the transistor in the pulse state, there is a need for pulse testing.At the same time due to technical difficulties in the manufacturing process, the current performance of the transistor Discrete