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像差校正电镜的出现,使人们可以从亚埃的尺度观察材料结构,从而可能给材料研究带来重大改变。以此为背景,第82期双清论坛“走向亚埃世界:材料界面工程中精细原子构型与其特性”于2012年10月21—23日在北京召开,来自国内外23个大学和科研院所的38名专家参加了这次论坛。论坛就球差矫正电镜的发展及其在材料结构观察和界面调制中的应用问题展开了热烈的讨论,凝练出了该领域的关键科学问题,对领域内需要重点发展及优先资助的方向提出了建议。
The advent of aberration-corrected electron microscopy, which allows one to observe the material structure from the Aye’s scale, may result in material changes in the material. Based on this background, the 82nd Shuangqing Forum “Going to Asia-Egypt: Fine Atom Configurations and Their Properties in Materials Interface Engineering” was held in Beijing on October 21-23, 2012, with 23 universities from home and abroad and 38 experts from research institutes attended this forum. Forum on the development of spherical aberration correction microscope and its application in the observation of material structure and interface modulation has heated discussions, concludes the key scientific issues in this area, the field needs to focus on the development and priority funding direction Suggest.