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采用电子探针(EPMA)显微分析方法,研究了β氧化铝陶瓷中的钠沉积现象。本方法具有同时实现钠沉积过程和钠含量分析的特点。对于表面蒸镀导电膜和未镀导电膜的试样所进行的实验表明,电子束轰击点的钠含量随轰击时间而增加。未镀导电膜试样的NaK_αX射线计数率较高,且出现起伏。钠含量的起伏变化可被解释为在轰击点的电荷积累以及由此导致的电子束漂移。给出了钠沉积过程的NaK_αX射线计数率变化曲线和钠沉积点的二次电子图像和NaK_αX射线面扫描图像。
Electron probe (EPMA) microscopic analysis was used to investigate the sodium deposition in β-alumina ceramics. The method has the characteristics of simultaneous sodium deposition process and sodium content analysis. Experiments on samples with vapor deposited conductive films and uncoated films show that the sodium content at the point of electron beam bombardment increases with the bombardment time. The NaK_α X-ray count rate of uncoated conductive film samples is high and fluctuates. Fluctuations in sodium content can be explained by the charge accumulation at the point of bombardment and the resulting electron beam drift. The NaK_α X-ray count rate curve and the secondary electron image of Na deposition point and the NaK_α X-ray surface scan image of sodium deposition process are given.