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SiO_2:F薄膜作为low-e玻璃的功能层材料,广泛应用于节能镀膜玻璃。对帮化学气相沉积法在玻璃表面沉积的约250 nm厚的SiO_2:F薄膜进行不同气氛的退火处理。结果发现,薄膜的电学、光学性能在氦气和空气两种不同的退火气氛下会有显著的变化。SiO_2:F薄膜的Low-e性能经过空气中高温退火下降明显。但在空气中退火后,再在氮气保护下退火,性能会有所恢复。对该现象的机理也进行了研究。
As a functional layer material of low-e glass, SiO 2: F thin film is widely used in energy-saving coated glass. The annealing of different atmospheres was carried out on the SiO_2: F film about 250 nm thick deposited by chemical vapor deposition on the glass surface. The results showed that the electrical and optical properties of the films changed significantly under two different annealing atmospheres of helium and air. The Low-e performance of SiO_2: F thin films decreased significantly after high temperature annealing in air. But in the air after annealing, then under the protection of nitrogen annealing, the performance will be restored. The mechanism of this phenomenon has also been studied.