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半导体激光器的强度和相位起伏一直是影响其应用的关键所在.在实验上研究了自由运转模式下半导体激光器的强度噪声.采用自制的分辨率为0.01nm的光谱仪成功地分辨出数十个边模,并利用射频低噪声光电探测器系统,分析了激光器的主模与边模之间以及各边模之间的强度噪声关联特性.从实验上证实了主模与边模之间的负关联效应,同时观察到边模之间存在的周期性负关联.该结果对进一步认识半导体激光器噪声的产生机制及强度压缩光的产生机制具有重要意义.
The strength and phase fluctuation of semiconductor lasers have always been the key to their application. The intensity noise of the semiconductor lasers in free-running mode has been experimentally studied. By using a homemade spectrometer with a resolution of 0.01 nm, several dozen side modes , And using the RF low-noise photodetector system, the intensity-noise characteristics of the laser between the main mode and the side modes and between the side modes are analyzed.The negative correlation between the main mode and the side mode is verified experimentally , While observing the periodic negative correlation existing between the side modes.This result is of great significance for further understanding of the mechanism of the noise generated by the semiconductor laser and the mechanism of the intensity of the compressed light.