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用横场伊辛模型研究了铁电薄膜的热力学性质 .在体系的哈密顿量中引入一个两维的在平面内的应力 ,并假设应力从基底材料和薄膜材料之间的界面层到薄膜的表面层是呈指数形式衰减的 .结果显示 :压应力有利于极化 ,使居里温度向高温区移动 ,而张应力对极化和居里温度的影响正好相反 .扩散长度对铁电薄膜的热力学性质有很大的影响
The thermodynamic properties of the ferroelectric thin films were investigated using the transverse field Ising model. A two-dimensional in-plane stress was introduced into the Hamiltonian of the system and the stress was assumed to vary from the interface layer between the base material and the thin film material to the thin film The surface layer decay exponentially.The results show that: the compressive stress is conducive to polarization, the Curie temperature to high temperature region, while the tensile stress on the polarization and the Curie temperature exactly the opposite diffusion length of the ferroelectric thin film Thermodynamic properties have a great impact