应激性防御反应与大白鼠脑内c-fos癌基因的表达及痛阈变化的关系

• 作 者: 金玉祥 陈嘉峰2 姚敏 胡波 王绍
• 机 构: 东北师范大学遗传与细胞研究所!吉林长春130024,白求恩医科大学生理学教研室!吉林长春130021现在地址为长春市白求恩医科大学第一临床医学院神医内科,南关区医院检验科!吉林长春130051,东北师
• 出 处: 中国神经科学杂志
• 发表日期: 2000年02期
• 关键词: 应激 c-fos c-fos癌基因 鼠脑 痛阈 慢性应激 大鼠 防御反应 应激性 大白鼠

采用足底电击结合噪音制做大鼠应激模型 ,以免疫组织化学 ABC法研究了大鼠脑内 c- fos癌基因蛋白 ( FOS)在慢性应激过程中的表达情况。结果显示 ,正常对照组大鼠脑内无 FOS阳性细胞出现。而应激组大鼠脑内 FOS的表达部位随应激时间的延长而呈下降趋势 ,说明随应激时间的延长大鼠脑内不同核团神经元功能发生不同程度的障碍。大鼠的痛阈在应激后 3,9d无明显变化而在第 1 5天大鼠痛阈明显升高 ,说明长时间的电刺激产生了镇痛。

The model of rat stress was established by the combination of plantar shock and noise. The expression of c-fos oncogene protein (FOS) in rat brain during chronic stress was studied by immunohistochemical ABC method. The results showed that no normal control group rats brain FOS-positive cells appear. However, the expression of FOS in the brain of stress rats decreased with the prolongation of stress time, indicating that neurons in different nucleus of rats experienced different degrees of dysfunction as time prolonged. Pain threshold in rats 3 and 9 d after stress did not change significantly in the first 15 days rat pain threshold was significantly increased, indicating that prolonged electrical stimulation produced analgesia.