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安赛乐米塔尔集团印第安纳港厂已经为其镀铝生产线采购了Indev公司生产的最先进的双X射线背散射测量系统。新的测量系统主要用于碳钢表面铝和锌镀层厚度的高精度测量。该系统采用开放架构控制系统进行设计,可以运行在Indev公司Gauge ViewTM软件平台之下。新的测量系统计划于2013年末投
ArcelorMittal Group Indiana Port Plant has purchased the state-of-the-art dual-X-ray backscatter measurement system from Indev for its aluminum production line. The new measurement system is mainly used for high-precision measurement of the thickness of aluminum and zinc coating on the surface of carbon steel. The system is designed with an open architecture control system and runs under Indev’s Gauge ViewTM software platform. The new measurement system is scheduled to be put in late 2013