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保偏光纤内部具有的高双折射,使其在内部传播的主模和耦合模之间存在一定的光程差。研究了高双折射波导中连续偏振耦合分布和分立点耦合的白光干涉测量法,推导出一种简明使用的公式,求出双折射波导的保偏参数,并且根据调制解调相关原理精确测量耦合点的强度和位置。实验测量了国产类矩形保偏光纤以及光纤偏振器。该方法最突出的优点是采用非破坏性方法测出保偏波导的每个局部的保偏参数,可用于检测集成波导器件和保偏光纤的质量、双折射波导之间的主轴对准、分布式光纤应变传感器等领域,并且可作为保偏光纤生产和使用的一种有效检测方法,大大提高集成波导器件及相关传感器的性能。
The high birefringence inside the PM fiber has certain optical path difference between the main mode and the coupling mode propagating inside. The white light interferometry for continuous polarization coupling and discrete point coupling in high birefringence waveguides has been studied. A concise formula is derived and the polarization maintaining parameters of birefringent waveguides are derived. The coupling The intensity and location of the point. Experimentally measured the domestic class rectangular PM fiber and optical fiber polarizer. The most prominent advantage of this method is that non-destructive methods are used to measure each local polarization maintaining parameter of the polarization maintaining waveguide, which can be used to detect the quality of the integrated waveguide device and the polarization-maintaining fiber, the alignment and distribution of the birefringent waveguides Fiber optic strain sensors and other fields, and can be used as a PM fiber production and use of an effective detection method, greatly improving the performance of integrated waveguide devices and related sensors.