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剪切干涉法是近二十年才发展起来的一种光学测试技术,因它不需要参考波面,而特别适用于光束质量检测等系统。但是剪切干涉图不能直接反映待测光束的波差,这就使剪切干涉图的处理极为复杂而限制了其广泛应用。目前横向剪切干涉图的处理研究取得
Shear interferometry is a kind of optical testing technology developed in recent twenty years because it does not need reference wave surface and is especially suitable for the system of beam quality testing. However, the shear interferogram can not directly reflect the wave aberration of the beam to be measured, which makes the processing of the shear interferogram extremely complicated and limits its wide application. The current research on the processing of transverse shear interferograms has been made