论文部分内容阅读
随着VLSI的迅速发展,可编程逻辑阵列(PLA)得到广泛的应用。因而它自身的可靠性问题受到人们的重视。本文考虑PLA中不同的故障复盖面而提出了两种PLA的容错设计方案,当容错PLA中出现任何单故障时,输出能保持正常。通过计算表明其可靠性得到明显提高。
With the rapid development of VLSI, Programmable Logic Arrays (PLA) are widely used. Therefore, its own reliability issues are people’s attention. In this paper, two fault tolerant design schemes of PLA are proposed considering different fault coverage in PLA. When any single fault occurs in fault tolerant PLA, the output can be kept normal. Through the calculation shows that the reliability has been significantly improved.