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提出了一种联合谱域与深度域光谱相位显微方法,该方法利用谱域相位信息克服2π歧义,并结合深度域相位信息,以实现高动态范围、高灵敏度的相位检测.首先通过理论推导和信号模拟,进行了深度域相位和谱域相位的灵敏度比较,证明了深度域相位在灵敏度上要高于谱域相位.进而详细介绍了联合谱域与深度域光谱相位显微方法.最后通过盖玻片和光学分辨率板实验验证了所提出的联合谱域与深度域光谱相位显微方法能够在实现高动态测量范围的同时保持高相位灵敏度.
A spectroscopic phase microscopy method is proposed, which can overcome the 2π ambiguity by using the phase information of the spectral domain and phase information in the depth domain to realize phase detection with high dynamic range and high sensitivity.Firstly, through theoretical derivation And signal simulation, the sensitivity comparison between the phase of the depth domain and the phase of the spectrum domain is performed, and it is proved that the phase of the depth domain is higher in sensitivity than the phase of the spectrum domain, and then the spectral phase microscopy method of the combined spectral domain and the depth domain is introduced in detail. The coverslips and optical resolution panels experimentally demonstrate that the proposed spectral phase and depth domain spectroscopic phase microscopy approach can achieve high phase sensitivity while maintaining a high dynamic range.