论文部分内容阅读
给出了国内首次 FL ASH ROM器件的中子辐照效应实验研究结果。发现 2 8F2 56和 2 9C2 56器件的14Me V中子辐照效应不同于以往所认为的单粒子效应 ,它只有“0”→“1”错误。错误发生有个中子注量阈值 ,当中子注量小于某一个值时 ,无错误 ;当中子注量达到一定值时 ,开始出现错误。随着中子注量的增加 ,错误数增加 ,直到所有“0”变为“1”。动态监测和静态加电的器件都出现硬错误 ,不能用编程器重新写入数据。错误随读取次数的增加而增加。在相同的中子注量下 ,不加电的器件无错误 ,而加电的器件都出现错误 ,并且出现不确定性错误
The experimental results of neutron irradiation on the first FL ASH ROM device in China are given. The 14Me V neutron irradiation effect of the 2 8F2 56 and 2 9C2 56 devices was found to be different from what was previously considered as a single-particle effect, with only “0” → “1” errors. There is a neutron fluence error threshold, when the neutron fluence is less than a certain value, there is no error; when the neutron fluence reaches a certain value, an error starts to occur. As the neutron fluence increases, the number of errors increases until all “0’s become” 1’s. Both dynamic monitoring and static power-up devices present hard errors and can not be rewritten with programmer. Errors increase with reading frequency. With the same neutron fluence, there is no error in a device that is not powered, and an error occurs in the powered device, and there is an uncertainty error