化学光谱法测定U_3Si_2中17种杂质元素

• 作 者: 孙桂良 汪宪明 杨翠蓉 杨平
• 机 构: 中国核动力研究设计院
• 出 处: 光谱实验室
• 发表日期: 1995年04期
• 关键词: 化学光谱 U_3Si_2 光谱测定 平面光栅摄谱仪 内标溶液 原子光谱分析 对电极 纸上色层法 光谱纯石墨电极 硝酸介质

本文介绍化学光谱法测定Ｕ_３Ｓｉ_２中１７种杂质元素。用ＴＢＰ作固定相，采用柱上萃取色层法分离铀与杂质元素，铯为外加基体，铟为内标。平均回收率在８８％—１１５％之间，相对标准偏差优于１３％。

This article describes the determination of 17 kinds of impurity elements in U_3Si_2 by chemical spectroscopy. Using TBP as the stationary phase, uranium and impurity elements were separated by column chromatography, cesium was applied matrix, and indium was used as internal standard. The average recovery was between 88% and 115%, with a relative standard deviation of better than 13%.