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现在常用的测镭方法均需将样品密封1～3倍氡的半衰期(约3～10天),这不可避免地带来分析周期长、由于密封而可能产生漏气以及样品周围介质对氡的吸收和渗透等缺点。样品不经密封而直接测定其镭浓度的方法,已成为一些放射性分析工作者探索的目标之一。有的作者已提出用Ge(Li)探测器测量镭的186keV特征光峰,从而有可能直接测定镭浓度;也有的作者曾用放化方法直接测镭本身的α放射性。但由于Ge(Li)探测器的灵敏体积小,需低温设备,成本昂贵以及化学处理手续繁杂等缺点,使得它们目前在生产中难于推广。有人认为使用NaI(T1)探测器是乏味费时和损失精度的。本实验则试用普通的NaI(T1)闪烁体和简单的单道能谱仪进行此项工作,并对某些影响因素作了初步探讨。
Now commonly used radium detection methods are required to seal the sample 1 to 3 times the half-life of radon (about 3 to 10 days), which inevitably lead to long analysis cycle, due to the seal may have leaks and samples around the absorption of radon And infiltration and other shortcomings. The method of directly measuring the concentration of radium without sealing the sample has become one of the objectives explored by some radioactive analysts. Some authors have proposed using the Ge (Li) detector to measure the 186 keV characteristic peak of radium, which makes it possible to directly measure the radium concentration. Some authors have also used the radiochemical method to directly measure the radiolucency of radium itself. However, due to the small sensitive volume, low temperature equipment, high cost and complicated chemical treatment procedures, Ge (Li) detectors are currently difficult to be popularized in production. Some people think that the use of NaI (T1) detector is tedious and time-consuming and loss of precision. In this experiment, the common NaI (T1) scintillator and simple single-channel spectrometer were used to do this work, and some influencing factors were discussed.