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在使用综合参数测试仪测试 80 8nm发射的半导体量子阱激光器的过程中 ,出现了一种由电浪涌所导致的灾变性损伤。通过测试的功率曲线和伏安特性曲线 ,断定激光器出现了灾变性的损伤 ,同时测试的发射光谱不再是激射光谱 ,而是由自发辐射所产生的荧光光谱。由扫描电镜 (SEM )观察到了激光器的腔面膜出现了熔化 ,证实激光器的确发生了灾变性损伤。作为对比 ,我们引用了另一种在测试中发现的快速退化现象 ,对两种退化出现的原因进行了理论上的分析 ,了解到激光器的退化主要还是由器件本身的材料、结构以及后期的工艺过程所决定的 ,在测试器件过程中电浪涌只不过会加速或产生突然灾变性退化。通过测试我们建立了一种比较简单的检验一个激光器质量可靠性的方法 ,所以理解由电浪涌所引起的退化行为是非常重要的
In the process of testing 80 8 nm semiconductor quantum well lasers using a comprehensive parametric tester, a catastrophic damage caused by an electrical surge occurred. By testing the power curve and the volt-ampere characteristic curve, it is concluded that the laser has a catastrophic damage. At the same time, the emission spectrum tested is no longer a lasing spectrum but a fluorescence spectrum generated by spontaneous emission. Scanning electron microscopy (SEM) observed that the cavity mask of the laser melted, confirming that the laser did indeed cause catastrophic damage. In contrast, we cite another phenomenon of rapid degeneration found during the test. The theoretical analysis of the causes of the two degenerations shows that the degradation of the laser is mainly caused by the material of the device itself, the structure, and the subsequent process The process determines that electrical surges can only be accelerated or cause sudden catastrophic degradation during device testing. Through testing we have established a relatively simple method of testing the quality and reliability of a laser, so it is important to understand the degenerative behavior caused by electrical surges