Current Mode Logic Testing of XOR/XNOR Circuit: A Case Study

• 作 者: Mona M. Fouad Hassanein H. Ame
• 机 构: CollegeofComputingandInformationTechnology,ElectronicsEngineeringDepartment,FacultyofEngineering,Rad
• 出 处: 电路与系统(英文)
• 发表日期: 2013年4期
• 关键词: CURRENT Mode LOGIC (CML) CMOS Testing Stuck-At FAULTS Current Mode Logic (CML) C

This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for testing CML gates. It is then proved that