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本文在叙述了整机所进行器件现场失效分析的意义之后,介绍了某整机用YS1000A,1.0μs延迟线的失效过程及特征,并较详细地叙述了该器件失效分析的试验技术。找出了该器件的失效原因是制造过程中工艺控制不够严格,使电感线圈的外引线有一部分打了折,被紧紧地压到地线下面,最后导致漏电而失效。文章最后对器件的失效过程、器件的结构和工艺上存在的其它缺陷进行了讨论和分析。
After describing the significance of on-site device failure analysis, the failure process and characteristics of YS1000A and 1.0μs delay line for a complete machine are introduced in this paper. The test techniques for failure analysis of the device are described in detail. To find out the cause of the failure of the device is the process of manufacturing process control is not strict enough, so that the induction coil part of the outer lead twists and turns, was tightly pressed under the ground, leading to leakage failure. Finally, the article discusses and analyzes the failure process of the device, the structure of the device and other defects in the process.