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本文报道了用 NaI(Tl)闪烁谱仪对国产 F34-Ⅰ型 X 射线机的重过滤 X 射线能谱的测量和解谱方法,给出一组测量结果,并对测量结果进行了比较和讨论。
In this paper, the method of measuring and resolving spectrum of the re-filtered X-ray energy spectrum of domestic F34-Ⅰ X-ray machine with NaI (Tl) scintillation spectrometer is reported. A set of measurement results are given and the measurement results are compared and discussed.