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本文介绍一种测定多相体系中各相间界面的方法,并以 TiO_2担体上载 Rh 的体系为例,作了测定的尝试。所用方法是从转靶 X 射线衍射仪上收集样品的小角散射强度,计算相关函数及电子密度起伏值,最后计算各相间的比界面。此法可用于多相体系作为一种物理表征的手段。
In this paper, a method for the determination of the interphases in multiphase systems is introduced. An attempt is made to take the Rh-loaded TiO 2 support as an example. The method used is to collect the small-angle scattering intensity of the sample from the target X-ray diffractometer, calculate the correlation function and the electron density fluctuation value, and finally calculate the interphase ratio interface. This method can be used in heterogeneous systems as a means of physical characterization.