Design of SRAM Testing System Based on Virtual Instrument Technology

• 出 处: Annual Report of China Institute of Atomic Energy
• 发表日期: 2007年00期
• 关键词: threaten valuable hardware panel something programmable requirement strange wave

The single event effects (SEE) threaten the reliability and life of semiconductor devices used to spacecrafts. So it is great significative and specific valuable to study the SEE of semiconductor devices.

The single event effects (SEE) threaten the reliability and life of semiconductor devices used to spacecrafts. So it is great significative and specific valuable to study the SEE of semiconductor devices.