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随着线路复杂性的增加,按照复杂线路的功能描述来确定其测试集成为必要的了。为此目的,一个按组合线路的二级与或形式的功能描述而不必按线路的结构描述来生成该线路测试集的算法将在本文中得到阐述。文中阐述的方法将对线路中所有多故障生成测试集,而不必对多故障的各种情形逐一地生成测试。为此目的,逻辑函数的多文字故障在本文中得到了系统的处理,它们之间的优势关系被充分地利用,一方面为了能生成完全的测试集,另一方面又能大大减少计算量。该文还给出了一个实用的算法,该算法既省时空,又能为许多实用的线路生成线路多故障的完全测试集。
As line complexity increases, it is necessary to determine its test integration as a function of the complexity of the circuit. For this purpose, an algorithm that computes the line test set in terms of a two-stage and / or functional description of a combined line without the need for a structural description of the line will be set forth herein. The approach described in this article will generate a test set for all the multiple faults in the line without having to generate the tests one by one for the various scenarios of multiple faults. To this end, multi-word failures of the logic functions are systematically addressed in this paper, and the dominant relationships between them are fully exploited, on the one hand to generate a complete test set and on the other hand to greatly reduce the amount of computation. The paper also presents a practical algorithm that saves time and space as well as generating a complete test suite for multi-fault circuits for many practical circuits.