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用Ｘ射线衍射（ＸＲＤ）和透射电镜术（ＴＥＭ）观察Ｓｉ和Ｇｅ基板上ＰｂＴｅ、ＣｄＴｅ及ＰｂＧｅＴｅ单层薄膜及其与ＺｎＳ组合的多层薄膜的显微结构，给出了薄膜附着牢固度与薄膜显微结构的关系
The microstructures of PbTe, CdTe and PbGeTe single-layer thin films on Si and Ge substrates as well as multilayer films combined with ZnS were observed by X-ray diffraction (XRD) and transmission electron microscopy (TEM) Relationship between film microstructure