论文部分内容阅读
用同步光电子能谱研究了NH4F/H2O2钝化p-CZT表面效应,钝化处理晶体表面后,表面态能峰消失。用未钝化和钝化两种工艺方法来对比p-CZT晶体表面的钝化效果。同时用同步光电子能谱研究了Au与p-CZT接触的界面势垒。其中界面势垒可以由价带区域的新能级EV-C和新能级与Fermi能级的差决定。未钝化和钝化的Au/p-CZT的界面势垒分别为(0.88±0.1)eV和(1.17±0.1)eV。
The surface effect of NH4F / H2O2 passivation on p-CZT was studied by synchronous photoelectron spectroscopy. After passivated, the peak of surface state disappeared. The unpassivated and passivated two methods were used to compare the passivation effect of p-CZT crystal surface. At the same time, the interface potential barrier between Au and p-CZT was studied by simultaneous photoelectron spectroscopy. The interface barrier can be determined by the difference between the new energy level EV-C and the new energy level in the valence band. The interfacial barriers of unpassivated and passivated Au / p-CZT were (0.88 ± 0.1) eV and (1.17 ± 0.1) eV, respectively.