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本文提出一种可用于三维面形测量的新的去包裹方法。它在原有传统去包裹的基础上提出分割线的方法，能够正确标出应该参与去包裹的象素点及由噪音造成的相位不连续点，因而，在相位图存在噪音及信噪比较低的情况下仍旧可以得到正确且唯一的去包裹相位值。在三维面形测量中，去包裹后的相位值可以真实反映待测物体的面形，因此有很大的理论价值及实际意义。
In this paper, we propose a new de-wrapping method that can be used for 3D surface profiling. On the basis of the traditional traditional unwrapping method, it proposes a method of dividing line, which can correctly identify the pixels that should be involved in wrapping and the phase discontinuity caused by noise. Therefore, there is noise in the phase diagram and the signal-to-noise ratio is relatively low It is still possible to get the correct and unique wrapping phase value. In the three-dimensional surface measurement, the phase value after unwrapped can truly reflect the surface shape of the object to be measured, so it has great theoretical value and practical significance.