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如何寻求一个最佳的测试节点或测试矢量集是模拟集成电路的故障诊断中的重要问题。该文提出了一种基于可测性测度计算的测试节点选择方法。利用行列式判决图,可以有效而准确地求得被测电路传输函数的符号表达式和计算出其可测性测度。该方法完全消除了由数字方法引入的不可避免的舍入误差,并能处理中、大规模的集成电路.
How to find an optimal test node or test vector set is an important issue in the fault diagnosis of analog integrated circuits. This paper presents a test node selection method based on the testability measure. Using the determinant graph, the symbolic expression of the transfer function of the circuit under test can be calculated effectively and accurately and its measurability measure can be calculated. The method completely eliminates the inevitable rounding error introduced by the digital method and can handle medium and large scale integrated circuits.