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利用XIS的Cls携上峰,X线激发俄歇线形,XPS价带谱以及俄歇电子能谱的CKLL线形研究了几种碳材料的化学状态和电子结构.研究结果表明:XPS的携上效应可以鉴别不同结构的碳材料.XAES的化学位移和线形也可以有效地研究各种不同的碳材料的成键方式.XPS的价带谱也是研究固体表面电子结构的一种有效方法,对碳材料的研究也很有效.AES的CKLL俄歇线形非常适合金属碳化物的鉴别.
The chemical states and electronic structures of several carbon materials were investigated by X-ray photoelectron spectroscopy and X-ray excited Auger linear, XPS valence band spectroscopy and Auger electron spectroscopy. The results show that the XPS carrying effect Can identify different structures of carbon materials.XAES chemical shift and linear can also effectively study the bonding of different carbon materials.XPS valence band spectrum is also an effective way to study the electronic structure of the solid surface of the carbon material Of the research is also very effective.AES CKLL Auger line is very suitable for the identification of metal carbides.