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采用结构新颖的多层叠盘式饱和器;以双压法原理为基础,研制了一套高精度宽量程的精密露点发生装置。该装置体积小操作方便,露点发生精度在—40～60℃d.p范围内均优于±0.1℃d.p,与M3/1311XR精密露点仪的比对结果良好符合,适用于校正各种露点仪和微水分仪。
Adopting a novel structure of multi-layer stacked disk saturator; based on the principle of double-pressure method, a set of precise dew-point generating device with high precision and wide range has been developed. The device is small and easy to operate. The accuracy of the dew point is better than ± 0.1 ℃ dp in the range of -40 ~ 60 ℃ dp, which is in good agreement with that of the M3 / 1311XR precision dew point meter. It is suitable for calibrating various dewpoint and micro Moisture meter.