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基于逻辑电路的单固定故障模型和逻辑函数质蕴涵的特点，定义了两种交运算，并讨论了利用元件的最小０覆盖和１覆盖求交运算产生电路测试和检测集的方法。
Based on the single fixed fault model of logic circuit and the implication of logic function, two types of intersection calculation are defined, and the method of generating circuit test and detection set by using minimum 0 coverage and 1 coverage intersection calculation is discussed.