TEM study of layered defects in high J_c MTG-YBCO

• 作 者: 王葛亚 施天生 傅耀先 蔡传兵 杨宏川
• 机 构: Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, China,Shanghai Insti
• 出 处: Science in China,Ser.A
• 发表日期: 1995年03期
• 关键词: YBCO defects layered dense systematically pinning numerous shaped anisotropic be

The microstructure and defects in melt-textured growth (MTG) YBa2Cu3O7-x (YBCO) bulk material have been studied systematically using high resolution transmission electron microscopy (HREM), and the relationship between the anisotropic critical current density Jc and the microstructure has been explored. The results indicate that there are numerous dense and nonunifonnly-distributed intergrowth-type layered defects orienting parallel to the ab plane in MTG-YBCO. These defects may serve as effective flux pinning centres for H//ab. The layered defects parallel to the ab plane together with the {110} twin boundaries are probably responsible for the anisotiopic behaviour of Jc depending upon the orientation of the external magnetic field.

The microstructure and defects in melt-textured growth (MTG) YBa2Cu3O7-x (YBCO) bulk material have been studied systematically using high resolution transmission electron microscopy (HREM), and the relationship between the anisotropic critical current density Jc and the microstructure has explored The results indicate that there are numerous dense and nonunifonnly-distributed intergrowth-type layered defects orienting parallel to the ab plane in MTG-YBCO. These defects may serve as effective flux pinning centers for H // ab. The layered defects parallel to the ab plane together with the {110} twin boundaries are probably responsible for the anisotiopic behavior of Jc depending upon the orientation of the external magnetic field.