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通过真空镀膜法在单晶硅片上制备了酞菁铟（ＩｎＰｃ）薄膜，在波长扫描和入射角可变全自动椭圆偏振光谱仪上研究了ＩｎＰｃ薄膜的椭偏光谱，发现ＩｎＰｃ薄膜在６００～８００ｕｍ波长范围内有较大的吸收并分析了其电子结构。
The InPc films were prepared on the single crystal silicon wafer by vacuum deposition method. The spectroscopic ellipsometry of InPc films was investigated by wavelength scanning and variable angle of incidence automatic ellipsometry. In the wavelength range, there is a greater absorption and analysis of its electronic structure.