Complete approach to automatic identification and sub-pixel center location for ellipse feature

• 作 者: XUE Ting WU Bin SUN Mei YE She
• 机 构: CollegeofElectricalandAutomationEngineering,StateKeyLaboratoryofPrecisionMeasuringTechnologyandInstr
• 出 处: 光电子快报：英文版
• 发表日期: 2008年1期
• 关键词: 光检测技术 自动识别 椭圆 中心定位
• 基金项目: This work has been supported by the Special Funds of National Natural Science Funds of China （ No. 50327501）, the Major Project of Natural Science Fundation of Tianjin in China [05YFJZJC01700]

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is ide