Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO_4 laser

• 作 者: 王伟平 谈宜东 张书练 李岩
• 机 构: Department of Precision Instrument,State Key Lab of Precision Measurement Technology and Instrument,
• 出 处: Chinese Optics Letters
• 发表日期: 2015年12期
• 关键词: confocal Together scattered precisely longitudinal axial coated relaxation grati

A new optical method based on frequency-shift feedback and laser confocal microscopy is presented to noninvasively measure a microstructure inside a sample. Due to the limit of axial resolution caused by poor signal detection ability, conventional laser feedback cannot precisely measure the microstructure. In this Letter, the light scattered by the sample is frequency shifted before feedback to the laser to obtain a magnification. Weak signals that change with the microstructure can be detected. Together with the tomography ability of laser confocal microscopy, the inner microstructure can be measured with high axial resolution.

A new optical method based on frequency-shift feedback and laser confocal microscopy is presented to noninvasively measure a microstructure inside a sample. Due to the limit of axial resolution caused by poor signal detection ability, conventional laser feedback can not precisely measure the microstructure. Letter, the light scattered by the sample is frequency shifted before feedback to the laser to obtain a magnification. Weak signals that change with the microstructure can detected. Together with the tomography ability of laser confocal microscopy, the inner microstructure can be measured with high axial resolution.