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@@@@Several new MEMS Inertial Measurement Unit (IMU) sensor products have been released recently with improved performance, which have the potential to support much higher precision applications. New MEMS IMUs include the NavChip from InterSense, the Nav440 from Crossbow, the Landmark30/40 from GTI, the SDI500 from Systron Donner. Since they are new in the market, currently there is limited information about their error characterization which however is important for the construction of proper error models for their integration with other sensors such as GPS. This paper will investigate the error characterization of two new MEMS IMU sensors, namely the NavChip and Nav440, using Allan variance technique. In addition to identifying different error terms, different stochastic error modeling methods, such as Gauss-Markov (GM) and Autoregressive (AR) processes, will also be investigated to assess the MEMS IMU sensor biases. Investigation to integrate new MEMS IMU sensors with Precise Point Positioning (PPP) will also be conducted to address the re-convergence issues.