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本文叙述了用CS-9000型薄层色谱仪测定分形分数维的方法。用计算机模拟的DLA模型分形图进行测量对照。在此基础上,对实际准晶的二值化分维图形进行测量,估算了测量的精度。
This article describes the method for the determination of fractal dimensions using the CS-9000 TLC. Comparing DLA model fractal image with computer simulation. On this basis, the actual quasicrystal binary fractal dimension is measured, and the accuracy of the measurement is estimated.