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最近国外发展了一种快速寻迹红外线显微镜,只须简捷测试就能断定将发生故障的电子器件的部位. 由于半导体器件或积分电路内所有电势故障的原因都会引起不正常的热现象,应用性能分析器来检查微电路发生故障是最切实可靠的方法之一.
Recently, a rapid tracing infrared microscope has been developed abroad and only a brief test is required to determine the location of the electronic device to be faulty. Since all potential faults in the semiconductor device or integrating circuit cause abnormal thermal phenomena, the application performance Analyzer to check microcircuit failure is one of the most practical and reliable method.