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1985—1987年在美国爱达荷大学对19个普通小麦(Triticum aestivum L.)品种进行了小麦成熟期穗发芽抗性及其鉴定方法的研究。结果表明,除红粒品种普遍抗穗发芽外,不少白粒品种也具有较强的抗性,特别是中国品种丰产3号的抗性最强,超过美国的软质白粒抗源 Peck 和 Brevor。证明小麦穗发芽与籽粒α-淀粉酶活性高度正相关,而与脱落酸含量无关,培养皿种子发芽法是鉴定穗发芽抗性的简易方法,种子发芽指数是衡量抗性强弱的可靠指标。
From 1985 to 1987, 19 wheat cultivars (Triticum aestivum L.) were tested for their sprouting resistance during wheat maturity and their identification methods at the University of Idaho, USA. The results showed that, except for the common red spike varieties resistant to sprouting, many white varieties also have strong resistance, especially the Chinese variety Fengshen 3 the strongest, more than the US soft white particles Peck and Brevor. It was proved that spikelet emergence was positively correlated with grain a-amylase activity, but not with the content of abscisic acid. Petri dish germination method was a simple method to identify the sprouting resistance of spikelet. Seed germination index was a reliable indicator to measure the resistance strength.