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含超薄膜结构的层状吸收器不仅设计加工结构十分简单,而且保证了优异的吸收性能,因而获得了越来越多的关注。层状结构实现完全吸收的机理,可以归结为吸收器在入射界面处导纳与入射空间导纳完全匹配。根据导纳分析理论,本文发展了一种可直接计算材料最优光学常数的方法,用于指导层状吸收器的材料优化选择。在不同的吸收基底上实现完全吸收,研究发现镀层薄膜的复折射率实部和虚部满足近似的线性关系,这对层状薄膜吸收器材料选择提供了必要的选择依据。根据导纳轨迹规律,仅借助导纳轨迹图,可以快速确定吸收材料的优化光学常数范围,因此对于估计和快速设计有着良好的参考价值。
Layered absorber with ultra-thin film structure is not only designed to process the structure is very simple, but also ensures excellent absorption performance, which received more and more attention. The mechanism of complete absorption of the layered structure can be attributed to the fact that the absorber perfectly matches the admittance of the incident space at the entrance interface. According to the theory of admittance analysis, this paper develops a method that can directly calculate the optimal optical constants of materials, which is used to guide the material selection of layered absorber. It is found that the real part and the imaginary part of the complex refractive index of the coating film satisfy the approximate linear relationship, which provides the necessary choice for the material selection of the layered thin film absorber. According to the law of admittance trajectory, the optimal optical constant range of the absorbing material can be rapidly determined only by the admittance trajectory map, so it has a good reference value for the estimation and the rapid design.