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随着科学技术的发展,高纯稀土的应用日益广泛。氧化钆作为固体发光材料的基质,含有微量杂质元素则明显影响其发光性能,有些元素甚至使荧光猝灭。因此检测高纯氧化钆中的微量杂质元素含量是很有实际意义的。国内外对于氧化钆中非稀土元素的光谱法测定的研究工作不多。В.И.Кочина等报导以Ga_2O_3为载体测定了Gd_2O_3中11个微量元素。本文是用原子发射光谱法测
With the development of science and technology, the application of high purity rare earth is more and more widely. Gadolinium oxide, as the matrix of solid luminescent materials, contains a trace of impurity elements, which obviously affect its luminescent properties. Some elements even quench fluorescence. Therefore, the detection of trace impurities in high purity gadolinia is of great practical significance. At home and abroad for gadolinium oxide non-rare earth element spectrometry determination of the work is not much. В.И.Кочина et al reported Ga_2O_3 as carrier determination of Gd_2O_3 eleven trace elements. This article is measured by atomic emission spectrometry