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中国电子学会、中国核学会所属核电子学与核探测技术学会将于今年十一月在成都召开第三次全国抗辐射电子学学术讨论会。会议由核电子学与核探测技术学会副主任委员赖祖武研究员领导组织筹备。 会议征文内容包括:电子材料及器件的辐射效应及损伤机制、测试技术;电子元器件辐射加固的设计及制造工艺;电子线路和电子系统的抗辐射加固技术;核辐时环境分析、模拟辐射源及有关参数剂量的测试技术;EMP,IEMP,SGEMP现象及防护技术,EMP模拟源及实验方法;单粒子效应和损伤现象;加固和质量保证评价;辐射效应及加固
The Chinese Society of Electronics, the Institute of Nuclear Electronics and Nuclear Detection Technology affiliated to the Chinese Nuclear Society will convene the third national conference on radiation-resistance electronics in Chengdu in November this year. The conference was organized by the leader of the Institute of Nuclear Electronics and Nuclear Detection Technology, under the leadership of researcher Lai Zuwu. Conference essay content includes: electronic materials and devices of the radiation effects and damage mechanisms, testing technology; electronic components radiation reinforcement design and manufacturing processes; electronic circuits and electronic systems anti-radiation reinforcement technology; nuclear radiation environment analysis, simulation of radiation sources And related parameters of the dose testing techniques; EMP, IEMP, SGEMP phenomenon and protection technology, EMP simulation sources and experimental methods; single-particle effects and damage phenomena; reinforcement and quality assurance evaluation; radiation effects and reinforcement