Design of TE01δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film

• 作 者: Cheng Zeng Zheng-Xiang Luo Qi-
• 机 构: SchoolofOptoelectronicInformation
• 出 处: 中国电子科技：英文版
• 发表日期: 2008年2期
• 关键词: 高温超导体 表面电阻 电阻测量 电子学 High temperature superconductor surface resistance surface
• 基金项目: This work was supported by the National 863 Foundation of China under Grant No. TC265-C304.

A new TE01δ test probe with proper transmission factor is fabricated for the measurement of surface resistance of high temperature superconductor (HTS) thin film. Coupling holes instead of coupling loops are used in the probe for its easier machining and