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近年来,由于红外科学技术的迅速发展,有关著译日益增多,外商产品来华展出和我国参加外展的广泛交流,红外科技成果的推广应用,新进入红外队伍的人员大量增长,对使用和学习红外技术的有关术语及其测量方法迫切需要有个统一的大家公认的标准。这几年,国内学术界对此进行了许多工作。1979年杭州工作会议,1980年后的天津、苏州、西安等专业会议对此都进行了多次深入讨论。1982年3月中国光学学会红外、光电器件专业委员会根据几次讨论会意见,委托上海技物所几位同志执笔撰成《红外探测器参数检测规程(推荐稿)》(以下简称《规程》)。我们看后感到:此稿对促进进一步深入讨论和早日统一国内不同意见是
In recent years, due to the rapid development of infrared science and technology, there has been a great deal of increase in the number of new personnel entering the infrared team due to the increasing number of translations, extensive exchanges of foreign products exhibited in China and China’s participation in outreach, and the popularization and application of infrared scientific and technological achievements. And learn the relevant terms of infrared technology and its measurement methods urgently need to have a unified standard we all recognized. In recent years, a lot of work has been done by the domestic academic circles. The 1979 Hangzhou Working Conference, the professional conferences of Tianjin, Suzhou and Xi’an since 1980 all discussed in depth. March 1982 China Optical Society of infrared, optoelectronic devices Committee on the basis of several seminar views, commissioned a few Shanghai Science and Technology Commission, the author wrote a compilation of “infrared detector parameter testing procedures (recommended draft)” (hereinafter referred to as the “rules”) . When we look at it, we feel that this draft is of great value to further deepening discussions and early unification of domestic dissent